Veeco to Display Surface Metrology System at IMTS
September 8, 2010—
In booth# E-5439, Veeco Instruments Inc. will display its NPFLEX 3-D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The profiler combines Veeco's non-contact, white light optical profilers with an open access design enabling 3-D data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market sectors. The NPFLEX utilizes a gantry design to provide over 300 degrees of access for large samples. The unique option of a swiveling optical head permits routine investigation of highly curved samples and beveled edges. The system's white light interferometric technology provides greater accuracy, repeatability and, more importantly, data density than is possible with contact instrumentation. Other standard features include long working distance objectives, a proprietary objective crash-mitigation system, automation and field-stitching software, and patent-pending, ultra-uniform dual-LED illumination. Running on the Vision software platform, the NPFLEX provides access to over 200 distinct analyses, and over 1000 critical parameters for measuring curvature, lay, bearing ratio, wear, corrosion, and other critical parameters.
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|Veeco Instruments, Inc.|