IMTS Preview: Marposs Corporation
June 13, 2014
Marposs Corp. will introduce at IMTS-2014 in booth #E-5519, its new G25 gauging probe for contact scanning for pre- and post-process cycles on gear grinders and machining centers. Although the G25 device resembles a touch probe, it is actually a gauge with the ability to do both part surface scanning and perform touch functions for part positioning and measurement. The compact G25 device was developed to gauge parts while still fixtured in the machine in case reworking is required. When used for gear grinding, the G25 gauge identifies the part location and tooth spacing for purposes of aligning the part with the grinding wheel prior to grinding. The same device is then used to scan the profile of the finished part in a continuous cycle. The new G25 gauging probe has excellent measurement stability at high speeds, enabling a significant reduction in inspection time compared to using a touch probe. Other applications to which the new G25 gauge is suited include grinding of non-round parts where the user needs to check certain characteristics of the part after it is ground, or for verifying that a face of the part is in the correct orientation. The G25 probe is available with either analog or digital output depending upon the user’s requirements.
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