Taylor Hobson Introduces New High Resolution Instruments
A new series of high resolution instruments offering automated simultaneous surface and contour inspection has been introduced by Taylor Hobson, a unit of AMETEK Ultra Precision Technologies.
Precision machining and an FEA (Finite Element Analysis) optimized design combine to provide a low noise and high accuracy mechanical execution of the measuring axes. Balanced beam design allows the instruments to be used in any orientation. Traceable standards and algorithms effectively eliminate instrument influence from the measurement results. The instruments are available in 1mm, 2mm and 5mm gauge ranges with an 18 bit gauge for improved resolution in surface detail, contour and 3D measurement. Software for analysis of surface finish and form is included.
A unique temperature compensation system monitors and feeds back changes in ambient temperature, ensuring consistent system performance and high measurement integrity, regardless of environmental effects.
Taylor Hobson is a manufacturer of ultra-precision measurement instruments for a wide range of markets including optics, semiconductors, manufacturing and nanotechnology research. It is a unit of AMETEK, Inc., a manufacturer of electronic instruments and electromechanical devices with annual sales of more than US$3.6 billion.