New Four-Axis Stages for Critical Inspection, Manufacturing Features Sub-Micron Resolution
A new series of four-axis high-precision stages has been introduced by OES (Optimal Engineering Systems). This series features linear X- and Y-axis stages capable of sub-micron resolution, and stacked goniometers with resolutions of 0.0005 degrees (lower goniometer) and 0.0007 degrees (upper goniometer), driven by a 10-microstep stepping motor driver. The X and Y-axis stages are available with travel lengths of 15 mm, 30 mm, 50 mm, and 75 mm, and larger strokes are also available.
The stacked, alpha-beta goniometers have +/-10 degrees and +/-15 degrees of travel. The height of rotation of stacked goniometers is 50 mm.
These high-resolution stages are ideal for measuring angles, identifying crystals, estimating hyperspectral bidirectional reflectance and gloss measurements, measuring radiation patterns of LEDs, directing lasers, aligning mirrors, and manufacturing quartz oscillator plates using X-ray quartz cutting.
Depending on the levels of precision and speed of travel requirements, four motor options are available.
The XYHGG-01 option is stepper motor driven with knobs at the back of the stepper motors for manual adjustments.
Option -02 is driven by three-phase brushless servo motors, and option -03 is brushed DC servo motor driven.
