The new generation of Waveline W800 roughness and contour measuring devices, designed to meet a variety of customer requirements for flexible, precise, and fast measurement, will have its North American debut at IMTS 2018 at Booth E-135536. The series includes four different configurations. A 120 mm traverse unit and 500 mm vertical measuring column are included on the basic configurations.
An axis travel speed more than six times faster than previous models and an improvement in the ambient noise of approximately 30 percent demonstrate the significant performance improvement in comparison to existing models.
The new W800 model series offers a probing system for every application, so the instrument is well suited to many different measuring tasks in the measuring room, including both manual or semi-automated measuring processes. An additional benefit is the ease with which the probing systems can be swapped via a new magnetic quick-change adapter. This provides a very high degree of flexibility to daily routine measurements. Measuring station configurations are modular and can easily be expanded at a later stage or integrated into existing measuring systems.
Jenoptik measuring instruments can be used to measure either the roughness or contours of nearly any workpiece with instruments that work in multiple measurement runs and models that measure in a single probe step. The company also features mobile and stationary systems for simple and complex measuring tasks. Jenoptik instruments can detect even the smallest deviations from the standard, ensuring components are produced with consistently high quality.